Product line
Gatan supplies products for Electron Microscopy. Above: Precision Etching & Coating System for specimen prep.
Gatan
Over 40 years as the industry leader in the design and manufacture of instruments and products for Electron Microscopes. Gatan has a wide range of products that includes, a full line of instruments for complete EM specimen prep. Specialised specimen holders for TEM & SEM for advanced applications. CCD cameras designed and optimized for a wide range of TEM applications, offering the ultimate performance in image quality with the latest fiber-optical coupling technology. Analytical studies for TEM in the form of electron energy loss spectroscopy (EELS) and energy-filtered TEM (EFTEM). Cathodoluminescence (CL) and cryo transfer stage for SEM.
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alpha700 for automated Raman and AFM scans of large samples.
WITec
WITec is a manufacturer of high-resolution optical and scanning probe microscopes. Innovative modular design allows for combinational or stand-alone measurements for the following applications:
- Scanning Near-field optical Microscopy (SNOM or NSOM)
- Atomic Force Microscopy (AFM)
- Confocal Microscopy
- Raman Microscopy
The system provides reliable and sophisticated SNOM imaging, Confocal Raman Microscope capable of ultra-fast chemical imaging with a resolution down to 200nm using the latest technological breakthroughs like the Electron Multiplying CCD and a high-performance user-friendly Atomic Force Microscope.
Winner 2008
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4 point probe station with linear table for measurements on 45, 65,90 nm and larger technology.
Kleindiek
"Give your microscope a hand."
Kleindiek Nanotechnik designs and manufactures micro manipulators and linears tables for highly precise applications in the semiconductor, optics, micro-mechanics, medicine, gene- and bio-technology industry.
Kleindiek is proud to offer their customers
- 15 years market experience
- An installed base of over 500 systems
- Standardised products for many applications
- User friendly control interfaces
- Competent and reliable consulting
- Custom solutions
- Continuous innovative development
- Up to date production techniques
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NanoSys500. Allows deposition of size-selected nanoparticles generated from almost any elemental or alloy base material.
Mantis Deposition
Mantis Deposition offers a complementary range of instruments for the deposition and characterisation of nanoparticles.
- Nanoparticle Sources
- RF Atom Sources
- Mini E-beam Evaporators
- RF Ion Sources
- Thermal atomic O, H source
- Magnetron Sputter Sources
- Qprep Multifunction Systems
- Nanoparticle Deposition Systems
- Custom System Design
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VESTA, the world's first "point and click" Localized Thermal Analyzer.
Anasys Instruments
Anasys Instruments, founded by pioneers of the AFM industry together with the scientists behind the R&D 100 & PittCon Gold awards for the original Micro Thermal Analysis technology offers sub 100nm Local Thermal Analysis.
- nano-TA2, sub 100 Local Thermal Analysis
- SThM, enables most AFMs to do temperature mapping
- VESTA, "point & click" Localized Thermal Analyzer
Winner 2007
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Nanonis SPM Controller. Upgrade your Scanning Probe Microscope Controller for better usability, stability and flexibility.
Nanonis
Nanonis SPM Control System is designed to be used on any Scanning Probe Microscope. Its modular concept implemented in a fully digital fashion is carefully through through, with strong empahsis on usability, stability and flexibility.
- Fully asynchronous multi-tasking user interface
- Digitally integrated Phase Locked Loop (PLL) for single or multiple frequencies
- Programming Interface for free customization
- Wide range of add-on modules for specialized applications
- Adaptation Kits for Omicron, Veeco MultiMode, JEOL and other microscopes
Download Demo software, STM Simulator with the link below!
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Nanofactory, in-situ TEM Probing made possible.
Nanofactory Instruments
Nanofactory, unique TEM holders for in situ probing of electrical and mechanical properties of nanostructures.
- single-tilt and double tilt TEM holders for electrical and force probing
- TEM electrical and force nano-probing systems
- scanning electrical and force nano-probing systems
- TEM-Nanoindenter systems for in-situ nanoindentation
Benefits
- locate and align a probe to nanoscale objects with high precision
- characterize both object and probe by high resolution imaging using TEM
- carry out electrical and mechanical probing in-situ
- study dynamical processes
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